Apr 28, 2024  
2008-2009 Academic Catalog 
    
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2008-2009 Academic Catalog [Published Catalog]

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EENG 413 - Testing of Digital Circuits

Basic concepts behind testing digital circuits. Causes of permanent and temporary failures. Test pattern generation techniques including exhaustive, Pseudo-exhaustive, Path sensitization, Critical path, Random and Pseudo-random Testing. Design for testability methods for testing Integrated Circuits. Techniques for testing Printed circuit boards.
Prerequisites
Prerequisite: EENG 210.
When Offered
Offered occasionally.
(3 cr.)


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