Mar 03, 2024  
2022-2023 Academic Catalog 
2022-2023 Academic Catalog [Published Catalog]

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ECNG 413/4103 - Testing of Digital Circuits (3 cr.)


Basic concepts behind testing digital circuits. Causes of permanent and temporary failures. Test pattern generation techniques including exhaustive, Pseudo-exhaustive, Path sensitization, Critical path, Random and Pseudo-random Testing. Design for testability methods for testing Integrated Circuits. Techniques for testing Printed circuit boards.

When Offered
Offered occasionally.

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