Jul 19, 2024  
2013-2014 Academic Catalog 
2013-2014 Academic Catalog [Published Catalog]

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MENG 528/5228 - Advanced Testing and Characterization Techniques (3 cr.)

Experimental techniques in the study of materials including quantitative measurements for the characterization of micro and nanostructured bulk and thin film materials using optical, electron and atomic force microscopy; Secondary ion mass spectroscopy (SIMS), Auger Electron Spectroscopy (AES), Rutherford Backscattering (RBS); EDX; X-ray diffraction and differential scanning calometry for thermal analysis. Advanced and conventional testing techniques for characterization of the physical, optical, magnetic and mechanical properties of micron and Nanomaterials and devices.

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