Dec 26, 2024  
2013-2014 Academic Catalog 
    
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2013-2014 Academic Catalog [Published Catalog]

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EENG 413/4103 - Testing of Digital Circuits (3 cr.)


Prerequisites
 

Description
Basic concepts behind testing digital circuits. Causes of permanent and temporary failures. Test pattern generation techniques including exhaustive, Pseudo-exhaustive, Path sensitization, Critical path, Random and Pseudo-random Testing. Design for testability methods for testing Integrated Circuits. Techniques for testing Printed circuit boards.

When Offered
Offered occasionally.


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