Jul 14, 2020  
2013-2014 Academic Catalog 
    
2013-2014 Academic Catalog [Archived Catalog]

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MENG 528/5228 - Advanced Testing and Characterization Techniques (3 cr.)



Description
Experimental techniques in the study of materials including quantitative measurements for the characterization of micro and nanostructured bulk and thin film materials using optical, electron and atomic force microscopy; Secondary ion mass spectroscopy (SIMS), Auger Electron Spectroscopy (AES), Rutherford Backscattering (RBS); EDX; X-ray diffraction and differential scanning calometry for thermal analysis. Advanced and conventional testing techniques for characterization of the physical, optical, magnetic and mechanical properties of micron and Nanomaterials and devices.
 

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